| dc.contributor.author | SOSIATI, HARINI | |
| dc.contributor.author | HATA, SATOSHI | |
| dc.contributor.author | KUWANO, NORIYUKI | |
| dc.contributor.author | TOMOKIYO, YOSHITSUGU | |
| dc.contributor.author | MATSUMOTO, AKIYOSHI | |
| dc.contributor.author | FUKUTOMI, MASAO | |
| dc.contributor.author | KITAGUCHI, HITOSHI | |
| dc.contributor.author | KOMORI, KAZUNORI | |
| dc.contributor.author | KUMAKURA, HIROAKI | |
| dc.date.accessioned | 2017-08-10T08:48:25Z | |
| dc.date.available | 2017-08-10T08:48:25Z | |
| dc.date.issued | 2004-06-11 | |
| dc.identifier.citation | 9 | en_US |
| dc.identifier.issn | 0389-2441 | |
| dc.identifier.uri | http://repository.umy.ac.id/handle/123456789/12699 | |
| dc.description.abstract | In order to understand the relationship between the microstructures and superconducting properties of MgB2 films, analytical TEM observations have been carried out. The films were fabricated by a KrF excimer laser deposition on Hastelloy substrates precoated with YSZ (yttria-stabilized zirconia). The deposited films were annealed under Ar atmosphere at 873 K for 1 h and at 953 K for 0.5 h. The critical current densities of these films were measured to be Jc=1x105 A/cm2 and Jc=7.7x103 A/cm2 at 4.2 K and 10 T, respectively. The conventional TEM observation showed nanocrystalline MgB2 and MgO of 5-30 nm in size dispersed in the films. Voids with various sizes from 10 to 60 nm were also observed in the films. Two-dimensional elemental analyses exhibited that near the MgB2/YSZ interface the films have a layered structure where the layers enriched with Mg and O have low B concentrations complementarily. The average sizes of the MgB2 and MgO grains and the voids increase with the annealing temperature. The enhancement of Jc value of the film annealed at 873 K may be due to smaller sizes of the MgB2 and MgO grains and voids than those at 953 K. | en_US |
| dc.description.sponsorship | Nanotechnology Support Project of the Ministry of Education, Culture, Sport, Science and Technology, Japan. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.subject | MgB2, Thin film, Transmission electron microscopy | en_US |
| dc.subject | Research Subject Categories::INTERDISCIPLINARY RESEARCH AREAS | en_US |
| dc.title | ELECTRON MICROSCOPY OF MGB2 THIN FILM ON YSZ-BUFFERED HASTELLOY | en_US |
| dc.type | Article | en_US |
