Browsing 04. LECTURERS ACADEMIC ACTIVITIES by Author "KUWANO, NORIYUKI"

Now showing items 1-12 of 12

    • CHANGES IN MICROSTRUCTURE OF AL/ALN INTERFACE DURING THERMAL CYCLING 

      NAGATOMO, YOSHIYUKI; KITAHARA, TAKESHI; NAGASE, TOSHIYUKI; KUROMITSU, YOSHIROU; SOSIATI, HARINI; KUWANO, NORIYUKI (The Japan Institute of Metals and Materials, 2008-12-01)
      Changes in the microstructure of the interface between an Al layer and an AlN plate during thermal cycling was studied to clarify the fracture mechanism of the Al/AlN interface. Observation of the interface with an ultra-sonic ...

    • EFFECTS OF HEAT TREATMENTS ON MICROSTRUCTURE FORMATION IN MGB 2 /YSZ/HASTELLOY FILM 

      HATA, SATOSHI; SOSIATI, HARINI; KUWANO, NORIYUKI; TOMOKIYO, YOSHITSUGU; MATSUMOTO, AKIYOSHI; FUKUTOMI, MASAO; KITAGUCHI, HITOSHI; KOMORI, KAZUNORI; KUMAKURA, HIROAKI (2005-06)
      Annealing processes in MgB2 films deposited on yttria-stabilized zirconia (YSZ)-buffered Hastelloy substrates were studied by transmission electron microscopy. The MgB2 films with Mg-rich compositions were fabricated at room ...

    • EFFECTS OF POST-PLATING REFLOW ON CHANGES IN CRYSTAL GRAIN SIZE OF SN-2 MASS% BI ALLOY PLATING WITH THERMAL CYCLING TREATMENT 

      KUWANO, NORIYUKI; JINNOUCHI, ATSUSHI; HORIKAMI, SADANORI; HIROKADO, NARUYOSHI; SOSIATI, HARINI (The Japan Institute of Metals and Materials, 2010-10-01)
      Changes in the grain size of tin (Sn) crystals associated with a thermal cycling treatment were investigated for layers of Sn-2 mass%Bi electroplated on Fe-42Ni substrates in order to clarify the effects of post-plating ...

    • ELECTRON MICROSCOPY OF MGB2 THIN FILM ON YSZ-BUFFERED HASTELLOY 

      SOSIATI, HARINI; HATA, SATOSHI; KUWANO, NORIYUKI; TOMOKIYO, YOSHITSUGU; MATSUMOTO, AKIYOSHI; FUKUTOMI, MASAO; KITAGUCHI, HITOSHI; KOMORI, KAZUNORI; KUMAKURA, HIROAKI (Elsevier, 2004-06-11)
      In order to understand the relationship between the microstructures and superconducting properties of MgB2 films, analytical TEM observations have been carried out. The films were fabricated by a KrF excimer laser deposition ...

    • MBE FABRICATION OF MNX P NANOWHISKERS 

      BOURAVLEUV, A D; SOSIATI, HARINI; ISHIBASHI, T; KUWANO, NORIYUKI; SATO, K (2008)
      MnP and MnP nanowhiskers have been grown by molecular-beam epitaxy (MBE) technique on InP(100) and GaAs(111)B substrates. The catalyst-free growth of nanowhiskers is found to be depended on the formation of Mn-based ...

    • MICROSTRUCTURES OF MGB2 /FE TAPES FABRICATED BY AN IN SITU POWDER-IN-TUBE METHOD USING MGH2 AS A PRECURSOR POWDER 

      HATA, SATOSHI; YOSHIDOME, TAKESHI; SOSIATI, HARINI; TOMOKIYO, YOSHITSUGU; KUWANO, NORIYUKI; MATSUMOTO, AKIYOSHI (IOP, 2006-01-04)
      Microstructures of MgB2/Fe tapes fabricated by an in situ powder-in-tube method using MgH2 as a precursor powder have been studied by means of x-ray diffraction and analytical transmission electron microscopy combined with ...

    • RELATIONSHIP BETWEEN MICROSTRUCTURE AND JC PROPERTY IN MGB2/Α-AL2O3 FILM FABRICATED BY IN SITU ELECTRON BEAM EVAPORATION 

      SOSIATI, HARINI; HATA, SATOSHI; KUWANO, NORIYUKI; TOMOKIYO, YOSHITSUGU; KITAGUCHI, HITOSHI; DOI, TOSHIYA; YAMAMOTO, HAJIME; MATSUMOTO, AKIYOSHI; SAITOH, KEISUKE; KUMAKURA, HIROAKI (IOP, 2005-08-09)
      A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness ...

    • REMOVING FOCUSED ION-BEAM DAMAGES ON TRANSMISSION ELECTRON MICROSCOPY SPECIMENS BY USING A PLASMA CLEANER 

      HATA, SATOSHI; SOSIATI, HARINI; KUWANO, NORIYUKI; ITAKURA, MASARU; NAKANO, TAKAYOSHI; UMAKOSHI, YUKICHI (OXFORD Academic, 2006-03-01)
      A plasma cleaner is usually used for removing carbonaceous debris from a specimen and preventing contamination during transmission electron microscopy (TEM) imaging and analysis. However, the plasma cleaner can be effectively ...

    • TEM AND SEM ANALYSIS FOR FORMATION MECHANISM OF TIN WHISKERS 

      KUWANO, NORIYUKI; HORIKAMI, SADANORI; MAEDA, MASANORI; SOSIATI, HARINI (Trans Tech Publications, 2012-07-09)
      Close observation with a transmission electron microscope (TEM) and a scanning electron microscope (SEM) was performed for the growth process of tin (Sn) whiskers on lead (Pb)-free Sn-plating. Whiskers were formed on a ...

    • TIN WHISKER FORMATION ON A LEAD-FREE SOLDER ALLOY STUDIED BY TRANSMISSION ELECTRON MICROSCOPY 

      SOSIATI, HARINI; KUWANO, NORIYUKI; HATA, SATOSHI; IWANE, Y; MORIZONO, Y; OHNO, Y (IEEE, 2006-12-06)
      Tin whiskers grown on a Sn/Cu-plated Polyimide (PI)-flexible substrate are a serious problem in electronic industrial application, because the whiskers lead to catastrophic electrical short circuit failures. Here, we report ...

    • TRANSMISSION ELECTRON MICROSCOPY ANALYSIS OF C4H4S-doped MgB2 TAPES 

      YUZURIHA, N; SOSIATI, HARINI; HATA, SATOSHI; KUWANO, NORIYUKI; YAMADA, H; UCHIYAMA, N; MATSUMOTO, AKIYOSHI; KITAGUCHI, HITOSHI; KUMAKURA, HIROAKI (IOP, 2008)
      It has been reported that doping with aromatic hydrocarbons in an in situ powder-intube fabrication process of MgB2 tapes is effective for increasing the critical current density (Jc) under magnetic fields. In this study, ...

    • TRANSMISSION ELECTRON MICROSCOPY OF SPONTANEOUS TIN (SN) WHISKER GROWTH UNDER HIGH TEMPERATURE/HUMIDITY STORAGE 

      SOSIATI, HARINI; HIROKADO, N; KUWANO, NORIYUKI; OHNO, Y (IEEE, 2008-12-09)
      The present work is devoted to characterize the microstructures of Sn/Cu lead-frame attached on the printed circuit board (PCB) and of tin-whiskers formed on the Sn-surface after exposure under 85C/85 %RH for 1000 and ...