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REMOVING FOCUSED ION-BEAM DAMAGES ON TRANSMISSION ELECTRON MICROSCOPY SPECIMENS BY USING A PLASMA CLEANER
(OXFORD Academic, 2006-03-01)
A plasma cleaner is usually used for removing carbonaceous debris from a specimen and preventing contamination during transmission electron microscopy (TEM) imaging and analysis. However, the plasma cleaner can be effectively ...
MBE FABRICATION OF MNX P NANOWHISKERS
(2008)
MnP and MnP nanowhiskers have been grown by molecular-beam epitaxy (MBE)
technique on InP(100) and GaAs(111)B substrates. The catalyst-free growth of nanowhiskers
is found to be depended on the formation of Mn-based ...