Browsing JURNAL by Author "NAKANO, TAKAYOSHI"
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REMOVING FOCUSED ION-BEAM DAMAGES ON TRANSMISSION ELECTRON MICROSCOPY SPECIMENS BY USING A PLASMA CLEANER
HATA, SATOSHI; SOSIATI, HARINI; KUWANO, NORIYUKI; ITAKURA, MASARU; NAKANO, TAKAYOSHI; UMAKOSHI, YUKICHI (OXFORD Academic, 2006-03-01)A plasma cleaner is usually used for removing carbonaceous debris from a specimen and preventing contamination during transmission electron microscopy (TEM) imaging and analysis. However, the plasma cleaner can be effectively ...