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RELATIONSHIP BETWEEN MICROSTRUCTURE AND JC PROPERTY IN MGB2/Α-AL2O3 FILM FABRICATED BY IN SITU ELECTRON BEAM EVAPORATION

SOSIATI, HARINI; HATA, SATOSHI; KUWANO, NORIYUKI; TOMOKIYO, YOSHITSUGU; KITAGUCHI, HITOSHI; DOI, TOSHIYA; YAMAMOTO, HAJIME; MATSUMOTO, AKIYOSHI; SAITOH, KEISUKE; KUMAKURA, HIROAKI (IOP, 2005-08-09)

A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness ...

FABRICATION OF MULTILAYERED MGB2/NI THIN FILMS AND THEIR FLUX PINNING PROPERTIES

TSUKANO, YUTAKA; DOI, TOSHIYA; YAMASHITA, HIROKI; TANAKA, AKIRA; IWASAKI, IKUMI; HAKURAKU, YOSHINORI; KITAGUCHI, HITOSHI; TAKAHASHI, KEN-ICHIRO; SOSIATI, HARINI; HATA, SATOSHI; IKEDA, KEN-ICHI; NAKASHIMA, HIDEHARU (IEEE, 2009)

We prepared the multilayered MgB2/Ni thin ﬁlms with the Ni layer spacings of 32, 23 and 16 nm. The multilayer nanostructure was conﬁrmed to be obtained from the scanning transmission electron microscope observation. The ...