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RELATIONSHIP BETWEEN MICROSTRUCTURE AND JC PROPERTY IN MGB2/Α-AL2O3 FILM FABRICATED BY IN SITU ELECTRON BEAM EVAPORATION
A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness ...
FABRICATION OF MULTILAYERED MGB2/NI THIN FILMS AND THEIR FLUX PINNING PROPERTIES
We prepared the multilayered MgB2/Ni thin ﬁlms with the Ni layer spacings of 32, 23 and 16 nm. The multilayer nanostructure was conﬁrmed to be obtained from the scanning transmission electron microscope observation. The ...