Now showing items 1-6 of 6
RELATIONSHIP BETWEEN MICROSTRUCTURE AND JC PROPERTY IN MGB2/Α-AL2O3 FILM FABRICATED BY IN SITU ELECTRON BEAM EVAPORATION
A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness ...
ELECTRON MICROSCOPY OF MGB2 THIN FILM ON YSZ-BUFFERED HASTELLOY
In order to understand the relationship between the microstructures and superconducting properties of MgB2 films, analytical TEM observations have been carried out. The films were fabricated by a KrF excimer laser deposition ...
TRANSMISSION ELECTRON MICROSCOPY ANALYSIS OF C4H4S-doped MgB2 TAPES
It has been reported that doping with aromatic hydrocarbons in an in situ powder-intube fabrication process of MgB2 tapes is effective for increasing the critical current density (Jc) under magnetic fields. In this study, ...
MBE FABRICATION OF MNX P NANOWHISKERS
MnP and MnP nanowhiskers have been grown by molecular-beam epitaxy (MBE) technique on InP(100) and GaAs(111)B substrates. The catalyst-free growth of nanowhiskers is found to be depended on the formation of Mn-based ...
EFFECTS OF POST-PLATING REFLOW ON CHANGES IN CRYSTAL GRAIN SIZE OF SN-2 MASS% BI ALLOY PLATING WITH THERMAL CYCLING TREATMENT
(The Japan Institute of Metals and Materials, 2010-10-01)
Changes in the grain size of tin (Sn) crystals associated with a thermal cycling treatment were investigated for layers of Sn-2 mass%Bi electroplated on Fe-42Ni substrates in order to clarify the eﬀects of post-plating ...
TEM AND SEM ANALYSIS FOR FORMATION MECHANISM OF TIN WHISKERS
(Trans Tech Publications, 2012-07-09)
Close observation with a transmission electron microscope (TEM) and a scanning electron microscope (SEM) was performed for the growth process of tin (Sn) whiskers on lead (Pb)-free Sn-plating. Whiskers were formed on a ...