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TRANSMISSION ELECTRON MICROSCOPY OF SPONTANEOUS TIN (SN) WHISKER GROWTH UNDER HIGH TEMPERATURE/HUMIDITY STORAGE
(IEEE, 2008-12-09)
The present work is devoted to characterize the microstructures of Sn/Cu lead-frame attached on the printed circuit board (PCB) and of tin-whiskers formed on the Sn-surface after exposure under 85C/85 %RH for 1000 and ...
CHANGES IN MICROSTRUCTURE OF AL/ALN INTERFACE DURING THERMAL CYCLING
(The Japan Institute of Metals and Materials, 2008-12-01)
Changes in the microstructure of the interface between an Al layer and an AlN plate during thermal cycling was studied to clarify the fracture mechanism of the Al/AlN interface. Observation of the interface with an ultra-sonic ...
TRANSMISSION ELECTRON MICROSCOPY ANALYSIS OF C4H4S-doped MgB2 TAPES
(IOP, 2008)
It has been reported that doping with aromatic hydrocarbons in an in situ powder-intube
fabrication process of MgB2 tapes is effective for increasing the critical current density (Jc) under magnetic fields. In this study, ...
MBE FABRICATION OF MNX P NANOWHISKERS
(2008)
MnP and MnP nanowhiskers have been grown by molecular-beam epitaxy (MBE)
technique on InP(100) and GaAs(111)B substrates. The catalyst-free growth of nanowhiskers
is found to be depended on the formation of Mn-based ...