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Now showing items 11-13 of 13
FABRICATION OF MULTILAYERED MGB2/NI THIN FILMS AND THEIR FLUX PINNING PROPERTIES
(IEEE, 2009)
We prepared the multilayered MgB2/Ni thin films with the Ni layer spacings of 32, 23 and 16 nm. The
multilayer nanostructure was confirmed to be obtained from the scanning transmission electron microscope observation. The ...
REMOVING FOCUSED ION-BEAM DAMAGES ON TRANSMISSION ELECTRON MICROSCOPY SPECIMENS BY USING A PLASMA CLEANER
(OXFORD Academic, 2006-03-01)
A plasma cleaner is usually used for removing carbonaceous debris from a specimen and preventing contamination during transmission electron microscopy (TEM) imaging and analysis. However, the plasma cleaner can be effectively ...
MBE FABRICATION OF MNX P NANOWHISKERS
(2008)
MnP and MnP nanowhiskers have been grown by molecular-beam epitaxy (MBE)
technique on InP(100) and GaAs(111)B substrates. The catalyst-free growth of nanowhiskers
is found to be depended on the formation of Mn-based ...