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Now showing items 11-15 of 15
REMOVING FOCUSED ION-BEAM DAMAGES ON TRANSMISSION ELECTRON MICROSCOPY SPECIMENS BY USING A PLASMA CLEANER
(OXFORD Academic, 2006-03-01)
A plasma cleaner is usually used for removing carbonaceous debris from a specimen and preventing contamination during transmission electron microscopy (TEM) imaging and analysis. However, the plasma cleaner can be effectively ...
MBE FABRICATION OF MNX P NANOWHISKERS
(2008)
MnP and MnP nanowhiskers have been grown by molecular-beam epitaxy (MBE)
technique on InP(100) and GaAs(111)B substrates. The catalyst-free growth of nanowhiskers
is found to be depended on the formation of Mn-based ...
EFFECT OF BALL-MILLING TREATMENT ON MICROSTRUCTURE OF IN SITU POWDER-IN-TUBE (PIT) MGB2 TAPE
(American Institute of Physics (AIP), 2012-06-25)
In an in situ powder-in-tube (PIT) fabrication of MgB2 superconducting tapes, it has been found that ball-milling treatment on a starting powder is effective for improving critical current density (Jc) of the MgB2 tapes. ...
TEM AND SEM ANALYSIS FOR FORMATION MECHANISM OF TIN WHISKERS
(Trans Tech Publications, 2012-07-09)
Close observation with a transmission electron microscope (TEM) and a scanning electron
microscope (SEM) was performed for the growth process of tin (Sn) whiskers on lead (Pb)-free
Sn-plating. Whiskers were formed on a ...
RELATIONSHIPS BETWEEN TENSILE STRENGTH, MORPHOLOGY AND CRYSTALLINITY OF TREATED KENAF BAST FIBERS
(American Institute of Physics (AIP), 2013-09-09)
Surface treatments on kenaf bast fibers were carried out with steam, alkali and a combination of steam-alkali. To verify and gain an understanding of their inter-relationship, tensile strength, surface morphology and ...